Author(s): George A. Dainis, III, Electronic Parts Department, Texas Instrument Incorporated, 34 Forest Street, Attleboro, MA, and Matthew O. Ward, Computer Science Department, Worcester Polytechnic Institute, Worcester, MA 01609

Source: Proc. of IEEE Conference on Computer Vision and Pattern Recognition, 1988.

Abstract: This paper describes work in progress at Worcester Polytechnic Institute towards implementing a rule-based visual inspection system. The target product for inspection is Integrated Circuit Leadframes. A frame based representation system is used to describe the product and defect categories. The system uses three levels of visual inspection to identify generic and specific inspection targets and defect categories.